electron microscope (TEM) lamella samples using focused ion beam (FIB), optimize sample preparation procedures and conditions..., and identify cutting locations based on pattern instructions. Operate metrology tools in the FIB & TEM lab to understand cross...
electron microscope (TEM) lamella samples using focused ion beam (FIB), optimize sample preparation procedures and conditions..., and identify cutting locations based on pattern instructions. Operate metrology tools in the FIB & TEM lab to understand cross...